Characterization of 3D/2D Sn-based perovskite heterostructure thin films prepared by sequential physical vapor deposition
Loading...
Date
Journal Title
Journal ISSN
Volume Title
Publisher
Elsevier
Abstract
Please read abstract in the article.
HIGHLIGHTS
• A thick two-dimensional layer lowers the quality of the films.
• Crystallinity and film morphology improves with annealing time.
• Two-dimensional layer slows down the nucleation rate of the three-dimensional-perovskite.
• Annealing suppresses the defect density and improves electron mobility of the films.
Description
DATA AVAILABILITY : Data will be made available on request.
Keywords
Sequential physical vapor deposition, Thickness optimization, Annealing time, 3D/2D perovskites, Sn-perovskites, X-ray diffraction (XRD), Phenethylammonium iodide (PEAI), Methylammonium iodide (MAI), Space charge limited current (SCLC)
Sustainable Development Goals
SDG-12: Responsible consumption and production
Citation
Sembito, A., Mwabora, J.M., Nyongesa, F.W. & Diale, M. 2026, 'Characterization of 3D/2D Sn-based perovskite heterostructure thin films prepared by sequential physical vapor deposition', Thin Solid Films, vol. 839, art. 140906, pp. 1-17, doi : 10.1016/j.tsf.2026.140906.